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Journal of Korean Society for Quality Management 2004;32(4): 184-. |
| Big Y 전개를 통한 장치 Line의 Yield 향상 |
| 문기주, 박우종 |
| 동아대학교 산업시스템공과 |
| Big Y development for line Yield Improvement in a Factor |
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| ABSTRACT |
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Current companies 집중 on how to operate and select projects to achieve the best result. 6sigma projects are chosen in the best suitable concept, which are solved by the 6Sigma experts according to the priority. And every project has to be launched not the view of individual management factors but the total factors, Big Y. Therefore, a process needs to be treated to connect the vital few factors in various processes to improve the yield, which is the main performance criteria in a manufacturing industry This report is to make the total optimization through the Vital-Few mapping between quality characteristics and process factors in a manufacturing line. Accordingly, it means to secure lower variance by making the CTP(Critical To Process) optimization and finally to improve the yield. |
| Key Words:
Big Y development;CTP Mapping;Project Down Flow;Vital-few;CTP Management System;Cause & Effect Analysis, Corrective Improvement, Preventive Control; |
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