Statistical Analysis of Degradation Data under a Random Coefficient Rate Model

Seo, Sun-Keun; Lee, Su-Jin; Cho, You-Hee

Journal of Korean Society for Quality Management > Volume 34(3); 2006 > Article

Journal of Korean Society for Quality Management 2006;34(3): 19-.

확률계수 열화율 모형하에서 열화자료의 통계적 분석

서순근, 이수진, 조유희

동아대학교 산업경영공학과

Statistical Analysis of Degradation Data under a Random Coefficient Rate Model

Sun-Keun Seo, Su-Jin Lee, You-Hee Cho

Dept. of Industrial & Management Systems Engineering, Dong-A University

ABSTRACT

For highly reliable products, it is difficult to assess the lifetime of the products with traditional life tests. Accordingly, a recent approach is to observe the performance degradation of product during the test rather than regular failure time. This study compares performances of three methods(i.e. the approximation, analytical and numerical methods) to estimate the parameters and quantiles of the lifetime when the time-to-failure distribution follows Weibull and lognormal distributions under a random coefficient degradation rate model. Numerical experiments are also conducted to investigate the effects of model error such as measurements in a random coefficient model.

Key Words: Degradation test;Random Coefficient Model;Reciprocal Weibull Distribution;Lognormal Distribution;